ST@f7000s:~]$ ./EBadmin/exposure-log -F 2025-05-01 -T 2025-07-31 -pbq -g makoto
from: 340 days ago
 to: 249 days ago
    EXP-     date    start    sec  rate hh:mm:ss BUF  adj   FP  mA WEC FocusPoint BEF  errors
-------- -------- -------- ------  ---- -------- --    --  [--] - ---------------
 w  0230 20250529 18:34.26    887  0.87  0:14.47 (1 -  31) [49]    D-LAB_makoto_Vernier-Wafer               wafer-100mm_49pts                        D-LAB_makoto_Wafer-pec.bef
 w  0234 20250529 19:14.15    886  0.87  0:14.46 (2 -  32) [49]    D-LAB_makoto_Vernier-Wafer               wafer-100mm_49pts                        D-LAB_makoto_Wafer-pec.bef
 
 w  1558 20250711 19:34.07     79* 0.08  0:01.19 (2 -  31) [49]    D-LAB_makoto_Vernier-Wafer-add50x50andRuler wafer-100mm_49pts                        D-LAB_standard_Ruler-v-100mm-0.8-pec.bef
 w  1559 20250711 19:38.12    908  0.87  0:15.08 (2 -  31) [49]    D-LAB_makoto_Vernier-Wafer-add50x50andRuler wafer-100mm_49pts                        D-LAB_standard_Ruler-v-100mm-0.8-pec.bef
 w  1562 20250711 19:46.29    911  0.88  0:15.11 (1 -  32) [49]    D-LAB_makoto_Vernier-Wafer-add50x50andRuler wafer-100mm_49pts                        D-LAB_standard_Ruler-v-100mm-0.8-pec.bef
 w  1592 20250714 19:37.51    472  1.77  0:07.52 (1 -  31) [12]  A D-LAB_makoto_Vernier-Wafer-alignment-layer2 D-LAB_makoto_4-inch-2442                 D-LAB_makoto_Vernier-layer2.bef