RF Reliability Characterization in CMOS Bulk and SOI Technologies for 5G Applications
| Presenter: |
Purushothaman Srinivasan |
GLOBALFOUNDRIES |
| Start: |
10:55 (30 minutes) |
Abstract
The reliability infrastructure developed for silicon logic is not adequate to address the needs for RF 5G applications. This tutorial will provide a practical overview of the challenges studying the reliability for 5G/mmWave/RF applications implemented with Si based bulk and SOI technologies. We will review reliability within the context of scaling, power and integration showing how these have positioned the Silicon and Silicon Germanium technologies as viable contenders for very high speed, high integration and high reliability applications. We will show a practical approach to the reliability evaluation of Power Amplifiers operating in mmWave and WiFi range along with a discussion of the qualification methodologies required for the release of these technologies to the field. We will cover aspects of the development of reliability models that work under industry standard circuit simulators that provide circuit designers with the necessary tools to extract the maximum performance while achieving optimum reliability. A brief overview of self-heating and its characterization in silicon-based systems will be also be presented. Throughout this tutorial we will show several examples of reliability stress data along with the models to support our methodology and conclusions.
Biography
The reliability infrastructure developed for silicon logic is not adequate to address the needs for RF 5G applications. This tutorial will provide a practical overview of the challenges studying the reliability for 5G/mmWave/RF applications implemented with Si based bulk and SOI technologies. We will review reliability within the context of scaling, power and integration showing how these have positioned the Silicon and Silicon Germanium technologies as viable contenders for very high speed, high integration and high reliability applications. We will show a practical approach to the reliability evaluation of Power Amplifiers operating in mmWave and WiFi range along with a discussion of the qualification methodologies required for the release of these technologies to the field. We will cover aspects of the development of reliability models that work under industry standard circuit simulators that provide circuit designers with the necessary tools to extract the maximum performance while achieving optimum reliability. A brief overview of self-heating and its characterization in silicon-based systems will be also be presented. Throughout this tutorial we will show several examples of reliability stress data along with the models to support our methodology and conclusions.
