The Fundamentals of Measurement Theory
| Presenter: |
Bill Verzi |
Keysight Technologies |
| Start: |
14:40 (60 minutes) |
Abstract
The sciences have always depended on experimentation for the proof that testing has given to the scientist. It is with experimental test that science advances. This discussion will highlight interesting aspects of experimental testing that have laid the foundation for modern scientific inquiry. We will see that much of what we do today to evaluate the semiconductor process has foundations in science discovered hundreds of years ago. From the beginnings of physical measurements in time to the advances in construction of experimental devices, we will see that knowledge and understanding have greatly advanced. After considering the fundamentals of test structures, this discussion will emphasize fundamentals of measurement technique, giving the student a solid foundation for reliable measurements. The search for new materials and devices required to drive progress in semiconductor device performance push the boundaries of electronic measurement capability. While we cannot deny the laws of physics, we can improve the ability to observe. What are the metrics for this improvement? How does precision, repeatability, and speed of execution affect our ability to observe? How does the knowledge of the limits of measurement help us? We shall discuss these issues and explore the limits of measurement capability in this discussion.
Biography
The sciences have always depended on experimentation for the proof that testing has given to the scientist. It is with experimental test that science advances. This discussion will highlight interesting aspects of experimental testing that have laid the foundation for modern scientific inquiry. We will see that much of what we do today to evaluate the semiconductor process has foundations in science discovered hundreds of years ago. From the beginnings of physical measurements in time to the advances in construction of experimental devices, we will see that knowledge and understanding have greatly advanced. After considering the fundamentals of test structures, this discussion will emphasize fundamentals of measurement technique, giving the student a solid foundation for reliable measurements. The search for new materials and devices required to drive progress in semiconductor device performance push the boundaries of electronic measurement capability. While we cannot deny the laws of physics, we can improve the ability to observe. What are the metrics for this improvement? How does precision, repeatability, and speed of execution affect our ability to observe? How does the knowledge of the limits of measurement help us? We shall discuss these issues and explore the limits of measurement capability in this discussion.
